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Fritz Keilmann

Fritz Keilmann

Infrared Nanoscopy Laboratory

Research

Our infrared nanoscope (s-SNOM) maps besides topography the infrared/THz response of ca. 20 nm deep surface layers, both at 20 nm spatial resolution. We use it to characterize (i) vdW materials and (ii) native biological objects protected by vdW crystals from dehydration.

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